MARC details
| 000 -LEADER |
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| fixed length control field |
01749nam a2200421 i 4500 |
| 001 - CONTROL NUMBER |
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| control field |
EBC5223913 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
MiAaPQ |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION |
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| fixed length control field |
m o d | |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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| fixed length control field |
cr cnu|||||||| |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
180524s2014 gw o 000 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| Cancelled/invalid ISBN |
9783832532611 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9783832596668 (e-book) |
| 035 ## - SYSTEM CONTROL NUMBER |
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| System control number |
(MiAaPQ)EBC5223913 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(Au-PeEL)EBL5223913 |
| 035 ## - SYSTEM CONTROL NUMBER |
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| System control number |
(CaPaEBR)ebr11539620 |
| 035 ## - SYSTEM CONTROL NUMBER |
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| System control number |
(OCoLC)1021809289 |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
MiAaPQ |
| Language of cataloging |
eng |
| Description conventions |
rda |
| -- |
pn |
| Transcribing agency |
MiAaPQ |
| Modifying agency |
MiAaPQ |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
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| Classification number |
TK7871.95 |
| Item number |
.R655 2014 |
| 082 0# - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
621.3815284 |
| Edition number |
23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Roll, Guntrade, |
| Relator term |
author. |
| 245 10 - TITLE STATEMENT |
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| Title |
Leakage current and defect characterization of short channel MOSFETs / |
| Statement of responsibility, etc |
Guntrade Roll. |
| 264 #1 - |
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| -- |
Berlin : |
| -- |
Logos Verlag Berlin, |
| -- |
[2014] |
| 264 #4 - |
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| -- |
©2014 |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
1 online resource (242 pages). |
| 336 ## - |
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| -- |
text |
| -- |
txt |
| -- |
rdacontent |
| 337 ## - |
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| -- |
computer |
| -- |
c |
| -- |
rdamedia |
| 338 ## - |
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| -- |
online resource |
| -- |
cr |
| -- |
rdacarrier |
| 490 0# - SERIES STATEMENT |
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| Series statement |
Research at NaMLab ; |
| Volume number/sequential designation |
2 |
| 588 ## - |
|---|
| -- |
Description based on print version record. |
| 590 ## - LOCAL NOTE (RLIN) |
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| Local note |
Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Metal oxide semiconductor field-effect transistors. |
| 655 #4 - INDEX TERM--GENRE/FORM |
|---|
| Genre/form data or focus term |
Electronic books. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Print version: |
| Main entry heading |
Roll, Guntrade. |
| Title |
Leakage current and defect characterization of short channel MOSFETs. |
| Place, publisher, and date of publication |
Berlin : Logos Verlag Berlin, c2014 |
| Physical description |
242 pages |
| Series data for related item |
Research at NaMLab ; 2 |
| International Standard Book Number |
9783832532611 |
| 797 2# - LOCAL ADDED ENTRY--CORPORATE NAME (RLIN) |
|---|
| Corporate name or jurisdiction name as entry element |
ProQuest (Firm) |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://ebookcentral.proquest.com/lib/bcsl-ebooks/detail.action?docID=5223913">https://ebookcentral.proquest.com/lib/bcsl-ebooks/detail.action?docID=5223913</a> |
| Public note |
Click to View |