Reliability characterisation of electrical and electronic systems / edited by Jonathan Swingler.
Material type:
TextSeries: Woodhead Publishing series in electronic and optical materials ; Number 74.Publisher: Cambridge, [England] : Woodhead Publishing, 2015Copyright date: ©2015Description: 1 online resource (274 pages) : illustrations, tablesContent type: - text
- computer
- online resource
- 9781782422259 (e-book)
- 621.381 23
- TK7835 .R455 2015
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds | |
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Ebrary Online Books
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Colombo | Available | CBERA1000584 | ||||
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Jaffna | Available | JFEBRA1000584 | ||||
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Kandy | Available | KDEBRA1000584 |
Enhanced descriptions from Syndetics:
This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices.
The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications.
Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisationIncludes bibliographical references and index at the end of each chapters.
Description based on print version record.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
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