Nonlinear transistor model parameter extraction techniques [electronic resource] / edited by Matthias Rudolph, Christian Fager, David E. Root.
Material type: TextSeries: Cambridge RF and microwave engineering seriesPublication details: Cambridge ; New York : Cambridge University Press, c2012.Description: xiv, 352 p. : illSubject(s): Genre/Form: DDC classification:- 621.3815/28 23
- TK7871.9 .N66 2012