Image from Syndetics
Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll.
Material type:
TextSeries: Research at NaMLab ; 2Publisher: Berlin : Logos Verlag Berlin, [2014]Copyright date: ©2014Description: 1 online resource (242 pages)Content type: - text
- computer
- online resource
- 9783832596668 (e-book)
- 621.3815284 23
- TK7871.95 .R655 2014
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|
Ebrary Online Books
|
Colombo | Available | CBERA10002942 | ||||
|
Ebrary Online Books
|
Jaffna | Available | JFEBRA10002942 | ||||
|
Ebrary Online Books
|
Kandy | Available | KDEBRA10002942 |
Total holds: 0
Description based on print version record.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
There are no comments on this title.
Log in to your account to post a comment.